[en] Quantum diffraction of fast atoms scattered from the topmost layer of surfaces under grazing angles of incidence can be employed for the analysis of detailed structural properties of insulator surfaces. From comparison of measured and calculated diffraction patterns we deduce the rumpling of the topmost surface layer of LiF(001) (i.e., an inward shift of Li(+) ions with respect to F(-) ions). The effect of thermal vibrations on the measurement of rumpling is accounted for by ab initio calculations of the mean-square vibrational amplitudes of surface ions. At room temperature this leads to a reduction of the apparent rumpling by 0.008 angstrom. We then obtain a rumpling of ( 0.05 +/- 0.04) angstrom, which improves its accuracy achieved in previous work.
Disciplines :
Physique
Auteur, co-auteur :
Schueller, A.; Humboldt-Universität zu Berlin > Institut für Physik
Wethekam, S.; Humboldt-Universität zu Berlin > Institut für Physik
Blauth, D.; Humboldt-Universität zu Berlin > Institut für Physik
Winter, H.; Humboldt-Universität zu Berlin > Institut für Physik
Aigner, F.; Vienna University of Technology > Institute for Theoretical Physics
Simonovic, N.; Vienna University of Technology > Institute for Theoretical Physics
Solleder, B.; Vienna University of Technology > Institute for Theoretical Physics
Burgdörfer, Joachim; Vienna University of Technology > Institute for Theoretical Physics
WIRTZ, Ludger ; Centre National de la Recherche Scientifique - CNRS > Department ISEN > Institute for Electronics, Microelectronics, and Nanotechnology (IEMN)
Langue du document :
Anglais
Titre :
Rumpling of LiF(001) surface from fast atom diffraction
Date de publication/diffusion :
2010
Titre du périodique :
Physical Review. A
ISSN :
1050-2947
eISSN :
1094-1622
Maison d'édition :
American Physical Society, College Park, Etats-Unis - Maryland
