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Article (Scientific journals)
Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
Schwarz, T.; Cojocaru-Mir edin, O.; Choi, P. et al.
2015 • In Journal of Applied Physics, 118, p. 095302 1-10
Peer Reviewed verified by ORBi
Permalink
https://hdl.handle.net/10993/21958
DOI
10.1063/1.4929874
 

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Disciplines :
Physics
Author, co-author :
Schwarz, T.;  Max-Planck-Institut fur Eisenforschung GmbH, Germany
Cojocaru-Mir edin, O.;  Max-Planck-Institut fur Eisenforschung GmbH, Germany
Choi, P.;  Max-Planck-Institut fur Eisenforschung GmbH, Germany
MOUSEL, Marina ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REDINGER, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
SIEBENTRITT, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Raabe, D.;  Max-Planck-Institut fur Eisenforschung GmbH, Germany
External co-authors :
yes
Language :
English
Title :
Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
Publication date :
2015
Journal title :
Journal of Applied Physics
ISSN :
0021-8979
eISSN :
1089-7550
Publisher :
American Institute of Physics, Melville, United States - New York
Volume :
118
Pages :
095302 1-10
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 10 September 2015

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