| Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction |
| English |
| Ramalingam, Srikumar [Mitsubishi Electric Research Laboratories (MERL)] |
| Goncalves Almeida Antunes, Michel [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >] |
| Snow, Daniel [Mitsubishi Electric Research Laboratories (MERL)] |
| Lee, Gim Hee [Mitsubishi Electric Research Laboratories (MERL)] |
| Pillai, Sudeep [Massachussetts Institute of Technology (MIT)] |
| 2015 |
| IEEE Conference on Computer Vision and Pattern Recognition (CVPR) |
| Yes |
| International |
| IEEE Conference on Computer Vision and Pattern Recognition (CVPR) |
| 7-06-2015 to 12-06-2015 |
| [en] line matching ; 3D Reconstruction |
| http://hdl.handle.net/10993/20806 |