Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction

Reference : Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction


	Document type :	Scientific congresses, symposiums and conference proceedings : Paper published in a book
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/20806

Title :	Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction
Language :	English
Author, co-author :	Ramalingam, Srikumar [Mitsubishi Electric Research Laboratories (MERL)]
	Goncalves Almeida Antunes, Michel [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
	Snow, Daniel [Mitsubishi Electric Research Laboratories (MERL)]
	Lee, Gim Hee [Mitsubishi Electric Research Laboratories (MERL)]
	Pillai, Sudeep [Massachussetts Institute of Technology (MIT)]
Publication date :	2015
Main document title :	IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Peer reviewed :	Yes
Audience :	International
Event name :	IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Event date :	7-06-2015 to 12-06-2015
Keywords :	[en] line matching ; 3D Reconstruction
Permalink :	http://hdl.handle.net/10993/20806

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