Article (Scientific journals)
Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layers using polarized Raman scattering
Krämmer, Christoph; Lang Mario; Redinger, Alex et al.
2014In Optics Express, 22
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Disciplines :
Physics
Author, co-author :
Krämmer, Christoph;  1Institute of Applied Physics, Karlsruhe Institute of Technology
Lang Mario;  1Institute of Applied Physics, Karlsruhe Institute of Technology
Redinger, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Sachs, Johannes;  1Institute of Applied Physics, Karlsruhe Institute of Technology
Chao Gao;  Institute of Applied Physics, Karlsruhe Institute of Technology
Kalt, Heinz;  Institute of Applied Physics, Karlsruhe Institute of Technology
Siebentritt, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Hetterich, Michael;  Institute of Applied Physics, Karlsruhe Institute of Technology
Language :
English
Title :
Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layers using polarized Raman scattering
Publication date :
2014
Journal title :
Optics Express
ISSN :
1094-4087
Publisher :
Optical Society of America, Washington, United States - District of Columbia
Volume :
22
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 26 January 2015

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