Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layers using polarized Raman scattering

Reference : Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layer...


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/19711

Title :	Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layers using polarized Raman scattering
Language :	English
Author, co-author :	Krämmer, Christoph [1Institute of Applied Physics, Karlsruhe Institute of Technology]
	Lang Mario [1Institute of Applied Physics, Karlsruhe Institute of Technology]
	Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Sachs, Johannes [1Institute of Applied Physics, Karlsruhe Institute of Technology]
	Chao Gao [Institute of Applied Physics, Karlsruhe Institute of Technology]
	Kalt, Heinz [Institute of Applied Physics, Karlsruhe Institute of Technology]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Hetterich, Michael [Institute of Applied Physics, Karlsruhe Institute of Technology]
Publication date :	2014
Journal title :	Optics Express
Publisher :	Optical Society of America
Volume :	22
Peer reviewed :	Yes (verified by ORBi^lu)
Audience :	International
e-ISSN :	1094-4087
City :	Washington
Country :	DC
Permalink :	http://hdl.handle.net/10993/19711
DOI :	10.1364/OE.22.028240

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