Article (Scientific journals)
Clustering Deviations for Black Box Regression Testing of Database Applications
Rogstad, Erik; Briand, Lionel
2016In IEEE Transactions on Reliability, 65 (1), p. 4-18
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Disciplines :
Computer science
Author, co-author :
Rogstad, Erik;  Simula Research Laboratory > Department of Software Engineering > PhD student
Briand, Lionel ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
yes
Language :
English
Title :
Clustering Deviations for Black Box Regression Testing of Database Applications
Publication date :
March 2016
Journal title :
IEEE Transactions on Reliability
ISSN :
0018-9529
Publisher :
IEEE
Volume :
65
Issue :
1
Pages :
4-18
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 12 January 2015

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