Direct Evaluation of Defect Distributions From Admittance Spectroscopy

Reference : Direct Evaluation of Defect Distributions From Admittance Spectroscopy


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/18698

Title :	Direct Evaluation of Defect Distributions From Admittance Spectroscopy
Language :	English
Author, co-author :	Weiss, Thomas [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Regesch, David [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Mousel, Marina [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	2014
Journal title :	IEEE JOURNAL OF PHOTOVOLTAICS
Volume :	4
Peer reviewed :	Yes
Audience :	International
Permalink :	http://hdl.handle.net/10993/18698

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