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Article (Scientific journals)
Direct Evaluation of Defect Distributions From Admittance Spectroscopy
WEISS, Thomas; REDINGER, Alex; REGESCH, David et al.
2014 • In IEEE JOURNAL OF PHOTOVOLTAICS, 4
Peer reviewed
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https://hdl.handle.net/10993/18698
DOI
10.1109/JPHOTOV.2014.2358073
 

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Disciplines :
Physics
Author, co-author :
WEISS, Thomas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REDINGER, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REGESCH, David ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
MOUSEL, Marina ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
SIEBENTRITT, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Language :
English
Title :
Direct Evaluation of Defect Distributions From Admittance Spectroscopy
Publication date :
2014
Journal title :
IEEE JOURNAL OF PHOTOVOLTAICS
Volume :
4
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 06 November 2014

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