Back
  1. Home
  3. Detailled Reference
Request a copy
Article (Scientific journals)
Direct Evaluation of Defect Distributions From Admittance Spectroscopy
WEISS, Thomas; REDINGER, Alex; REGESCH, David et al.
2014 • In IEEE JOURNAL OF PHOTOVOLTAICS, 4
Peer reviewed
Permalink
https://hdl.handle.net/10993/18698
DOI
10.1109/JPHOTOV.2014.2358073
 

Files (1)Send toDetailsStatisticsBibliographySimilar publications

Files

Full Text
direct evalution of defect distributions from admittance spectroscopy_weiss-redinger-regesch-mousel-siebentritt_2014.pdf
Publisher postprint (3.03 MB)
Request a copy

All documents in ORBilu are protected by a user license.

Send to


Details


Disciplines :
Physics
Author, co-author :
WEISS, Thomas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REDINGER, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REGESCH, David ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
MOUSEL, Marina ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
SIEBENTRITT, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Language :
English
Title :
Direct Evaluation of Defect Distributions From Admittance Spectroscopy
Publication date :
2014
Journal title :
IEEE JOURNAL OF PHOTOVOLTAICS
Volume :
4
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 06 November 2014

Statistics

Number of views
136 (14 by Unilu)
Number of downloads
1 (1 by Unilu)
More statistics
Scopus citations®
 
29
Scopus citations®
without self-citations
17
OpenAlex citations
 
29
WoS citations™
 
26

Bibliography

Similar publications


Contact ORBilu