| Reference : Local chemical composition of nanophase-separated polymer brushes |
| Scientific journals : Article | |||
| Physical, chemical, mathematical & earth Sciences : Physics | |||
| http://hdl.handle.net/10993/18232 | |||
| Local chemical composition of nanophase-separated polymer brushes | |
| English | |
Filimon, Marlena  [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] | |
| Kopf, Ilona [Ruhr-Universität Bochum - RUB] | |
| Bründermann, Erik [Ruhr-Universität Bochum - RUB] | |
| Havenith, Martina [Ruhr-Universität Bochum - RUB] | |
| 2011 | |
| Physical Chemistry Chemical Physics | |
| Royal Society of Chemistry | |
| Yes (verified by ORBilu) | |
| International | |
| 1463-9076 | |
| [en] Scannin near-filed microscopy ; polymer brushes ; local chemical composition | |
| [en] Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale
phase separation of mixed polystyrene–poly(methyl methacrylate) (PS–PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to top layers dominated by PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm . | |
| Researchers ; Professionals ; Students | |
| http://hdl.handle.net/10993/18232 |
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