Article (Scientific journals)
Local chemical composition of nanophase-separated polymer brushes
Filimon, Marlena; Kopf, Ilona; Bründermann, Erik et al.
2011In Physical Chemistry Chemical Physics
Peer reviewed
 

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Keywords :
Scannin near-filed microscopy; polymer brushes; local chemical composition
Abstract :
[en] Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene–poly(methyl methacrylate) (PS–PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to top layers dominated by PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm .
Disciplines :
Physics
Author, co-author :
Filimon, Marlena ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Kopf, Ilona;  Ruhr-Universität Bochum - RUB
Bründermann, Erik;  Ruhr-Universität Bochum - RUB
Havenith, Martina;  Ruhr-Universität Bochum - RUB
Language :
English
Title :
Local chemical composition of nanophase-separated polymer brushes
Publication date :
2011
Journal title :
Physical Chemistry Chemical Physics
ISSN :
1463-9076
Publisher :
Royal Society of Chemistry
Peer reviewed :
Peer reviewed
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