[en] The angular distribution of Xe6+ ions with an energy of 800 eV/q transmitted through Ni microcapillaries is studied by a classical trajectory simulation. The results for clean and contaminated by layers of insulating materials of the internal surface of capillary are presented. We show that the angular distributions can be used to identify different phases of hollow ion formation for clean metal surface. We also show that the angular distribution changes dramatically for the case of contaminated surface, i.e. when the image acceleration is depressed. (C) 2003 Elsevier Science B.V. All rights reserved.
Disciplines :
Physique
Auteur, co-auteur :
Tokesi, K.; Institute of Nuclear Research of the Hungarian Academy of Sciences, (ATOMKI) /Institute for Theoretical Physics, Vienna University of Technology
WIRTZ, Ludger ; Technische Universität Wien = Vienna University of Technology - TU Vienna > Institute for Theoretical Physics
Lemell, C.; Technische Universität Wien = Vienna University of Technology - TU Vienna > Institute for Theoretical Physics
Burgdorfer, J.; Technische Universität Wien = Vienna University of Technology - TU Vienna > Institute for Theoretical Physics
Langue du document :
Anglais
Titre :
Angular distribution of highly charged ions transmitted through metallic microcapillaries
Date de publication/diffusion :
2003
Nom de la manifestation :
22nd Werner Brandt Workshop Namur BELGIUM
Date de la manifestation :
JUN, 2002
Manifestation à portée :
International
Titre du périodique :
Journal of Electron Spectroscopy and Related Phenomena
ISSN :
0368-2048
Maison d'édition :
Elsevier Science, Amsterdam, Pays-Bas
Volume/Tome :
129
Fascicule/Saison :
2-3
Pagination :
195-200
Peer reviewed :
Peer reviewed vérifié par ORBi
Commentaire :
JUN, 2002
22nd Werner Brandt Workshop
Namur
BELGIUM
