Article (Scientific journals)
Raman imaging of graphene
Graf, D.; Molitor, F.; Ensslin, K. et al.
2007In Solid State Communications, 143 (1-2), p. 44-46
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Abstract :
[en] A Raman spectrum of a solid contains information about its vibrational and electronic properties. Collecting spectral data with spatial resolution and encoding it in a 2D plot generates images with information complementary to optical and scanning force imaging. In the case of few-layer graphene the frequency of the G line and especially the width of the D ' line turn out to be sensitive to single layers. The thickness of the few-layer graphene flake is reflected in the intensity of the G line and in the reduced intensity of the dominant peak of the underlying silicon oxide. (c) 2007 Elsevier Ltd. All rights reserved.
Disciplines :
Physics
Author, co-author :
Graf, D.;  ETH Zurich > Solid State Physics Laboratory
Molitor, F.;  ETH Zurich > Solid State Physics Laboratory
Ensslin, K.;  ETH Zurich > Solid State Physics Laboratory
Stampfer, C.;  ETH Zurich > Micro and Nanosystems
Jungen, A.;  ETH Zurich > Micro and Nanosystems
Hierold, C.;  ETH Zurich > Micro and Nanosystems
Wirtz, Ludger ;  Institut d'électronique de microélectronique et de nanotechnologie = Institute for Electronics, Microelectronics, and Nanotechnology - IEMN
Language :
English
Title :
Raman imaging of graphene
Publication date :
2007
Journal title :
Solid State Communications
ISSN :
0038-1098
Publisher :
Pergamon Press - An Imprint of Elsevier Science
Volume :
143
Issue :
1-2
Pages :
44-46
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 06 August 2014

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