[en] A Raman spectrum of a solid contains information about its vibrational and electronic properties. Collecting spectral data with spatial resolution and encoding it in a 2D plot generates images with information complementary to optical and scanning force imaging. In the case of few-layer graphene the frequency of the G line and especially the width of the D ' line turn out to be sensitive to single layers. The thickness of the few-layer graphene flake is reflected in the intensity of the G line and in the reduced intensity of the dominant peak of the underlying silicon oxide. (c) 2007 Elsevier Ltd. All rights reserved.
Disciplines :
Physics
Author, co-author :
Graf, D.; ETH Zurich > Solid State Physics Laboratory
Molitor, F.; ETH Zurich > Solid State Physics Laboratory
Ensslin, K.; ETH Zurich > Solid State Physics Laboratory
Stampfer, C.; ETH Zurich > Micro and Nanosystems
Jungen, A.; ETH Zurich > Micro and Nanosystems
Hierold, C.; ETH Zurich > Micro and Nanosystems
Wirtz, Ludger ; Institut d'électronique de microélectronique et de nanotechnologie = Institute for Electronics, Microelectronics, and Nanotechnology - IEMN