Reference : Raman imaging of graphene
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Raman imaging of graphene
Graf, D. [ETH Zurich > Solid State Physics Laboratory]
Molitor, F. [ETH Zurich > Solid State Physics Laboratory]
Ensslin, K. [ETH Zurich > Solid State Physics Laboratory]
Stampfer, C. [ETH Zurich > Micro and Nanosystems]
Jungen, A. [ETH Zurich > Micro and Nanosystems]
Hierold, C. [ETH Zurich > Micro and Nanosystems]
Wirtz, Ludger mailto [Institut d'électronique de microélectronique et de nanotechnologie = Institute for Electronics, Microelectronics, and Nanotechnology - IEMN]
Solid State Communications
Pergamon Press - An Imprint of Elsevier Science
Yes (verified by ORBilu)
[en] A Raman spectrum of a solid contains information about its vibrational and electronic properties. Collecting spectral data with spatial resolution and encoding it in a 2D plot generates images with information complementary to optical and scanning force imaging. In the case of few-layer graphene the frequency of the G line and especially the width of the D ' line turn out to be sensitive to single layers. The thickness of the few-layer graphene flake is reflected in the intensity of the G line and in the reduced intensity of the dominant peak of the underlying silicon oxide. (c) 2007 Elsevier Ltd. All rights reserved.

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