storing matter; Secondary Ion Mass Spectrometry; quantitative; surface analysis; Matrix effect; MetA-SIMS; polymers
[en] SIMS is a sensitive surface analysis method that is commonly used for a wide range of applications in various domains. Its major drawback is the so-called matrix effect, which is due to a change of the ionization efficiency as a function of the chemical environment of the considered atom or molecule and which makes quantitative analysis very difficult. The Storing Matter technique was developed in order to circumvent the matrix effect while still keeping an excellent sensitivity: in a first step, the sample surface is sputtered by an ion beam and the emitted matter is deposited at sub-monolayer level onto a dedicated collector. Then the collector is transferred under UHV conditions to a SIMS instrument where the deposit is analyzed. If the deposit coverage is in the sub-monolayer range, all the deposited particles are surrounded by the same matrix, i.e. the collector material.
The main goal of this work was the study and setup of experimental conditions for the application of the Storing Matter technique to organic samples. In this case, it is particularly important that molecular information is preserved. The key parameters of the technique were studied in detail and the optimal conditions with regard to high ionization efficiency and low fragmentation could be defined.
Author, co-author :
Becker, Nora; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Application of the Storing Matter technique to organic samples: fundamentals, applications, and evaluation of the analytical potential
Defense date :
29 September 2011
Unilu - University of Luxembourg, Luxembourg, Luxembourg