Reference : Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals a... |
Dissertations and theses : Doctoral thesis | |||
Physical, chemical, mathematical & earth Sciences : Physics | |||
http://hdl.handle.net/10993/15634 | |||
Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals and applications | |
English | |
Bendler, Beatrix [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] | |
24-Sep-2012 | |
University of Luxembourg, Luxembourg, Luxembourg | |
Docteur en Physique | |
Siebentritt, Susanne ![]() | |
Wirtz, Tom | |
http://hdl.handle.net/10993/15634 |
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