Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals and applications

Reference : Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals a...


	Document type :	Dissertations and theses : Doctoral thesis
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/15634

Title :	Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals and applications
Language :	English
Author, co-author :	Bendler, Beatrix [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	24-Sep-2012
Institution :	University of Luxembourg, Luxembourg, Luxembourg
Name of the degree :	Docteur en Physique
Supervisor :	Siebentritt, Susanne
	Wirtz, Tom
Permalink :	http://hdl.handle.net/10993/15634

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