Electrical and opto-electrical characterization of large area semiconductor devices

Reference : Electrical and opto-electrical characterization of large area semiconductor devices


	Document type :	Patent : Patent
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Chemistry
	To cite this reference:	http://hdl.handle.net/10993/13869

Title :	Electrical and opto-electrical characterization of large area semiconductor devices
Language :	English
Author, co-author :	Dale, Phillip [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	7-Jun-2012
Creation date :	2010-04-27
Publisher :	United States
Patent/publication number (10-11) :	US 2012/0139551 A1
Priority number (30) :	US 2012/0139551 A1
Report number :	B
Country :	United States
Depositor :	Université de Luxembourg
	TDK Corporation, Japan
International classification (IPC) (51) :	G01R 31/26
European classification (ECLA) (52) :	324/501,342/762.01
International protection: country codes (81) :	US 2012/0139551 A1
European protection: country codes (84) :	US 2012/0139551 A1
Permalink :	http://hdl.handle.net/10993/13869

File(s) associated to this reference

Fulltext file(s):

	File	Commentary	Version	Size	Access
Limited access	2012_PATENT_ electrical and opto electrical chatracterization of large area semiconductor devices_08339-8 US Published Application.pdf		Publisher postprint	668.9 kB	Request a copy

All documents in ORBi^lu are protected by a user license.