Paper published in a book (Scientific congresses, symposiums and conference proceedings)
The Impact of Concurrent Coverage Metrics on Testing Effectiveness
Hong, Shin; Staats, Matthew; Ahn, Jaemin et al.
2013In The Impact of Concurrent Coverage Metrics on Testing Effectiveness.
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Hong, Shin
Staats, Matthew ;  Division of Web Science and Technology > KAIST > South Korea
Ahn, Jaemin
Kim, Moonzoo
Rothermel, Gregg
Language :
English
Title :
The Impact of Concurrent Coverage Metrics on Testing Effectiveness
Publication date :
2013
Event name :
ICST 2013
Event date :
July 15
Main work title :
The Impact of Concurrent Coverage Metrics on Testing Effectiveness.
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 16 December 2013

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