Raman spectroscopy on single- and few-layer graphene

We report on Raman measurements of single- and few-layer graphene flakes. Raman mapping in combination with scanning force microscopy allows us to locally relate the thickness of the graphite flake with the spectral properties. It turns out that the width of the D' line is highly sensitive to the transition from single- to double-layer graphene. The defect-induced D line is found to be most prominent at steps between sections of different height and along the edge of the graphite flake.