Reference : Random Cluster Sampling on X-Machines Test Cases
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
Random Cluster Sampling on X-Machines Test Cases
Khan, Yasir Imtiaz mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
kausar, sadia mailto [University of Lahore Pakistan]
11th International Conference on Information Technology : New Generations ITNG 2013
11th International Conference on Information Technology : New Generations ITNG 2013
15-17 April 2013
[en] software testing ; X-machines ; random cluster sampling
[en] Software testing is considered one of the most
expensive and critical phases of the software development.
Formal testing approaches are extensively used for verifying the
conformance of implementations to a given specification. These
formal approaches usually generate a large amount of input test
data which is costly in terms of time and effort. Techniques
for reducing test input data are thus of the utmost importance.
The contribution of this paper is to propose a framework for
the reduction of test input data generated by a formal testing
approach based on X-Machines.
To achieve these objectives we have applied a well known
statistical approach called Random Cluster Sampling on the
test case set generated by a formal approach X-Machines.
To exemplify our technique we have generated a test set for
an X-Machine Microwave oven specification and then drew a
sample from the test set by using the Random Cluster sampling
technique. Based on the tolerated fault rate we have extracted
conclusion about the accuracy of implementation.
Researchers ; Professionals ; Students ; General public

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