N-Gram Based Test Sequence Generation from Finite State Models

Reference : N-Gram Based Test Sequence Generation from Finite State Models


	Document type :	Scientific congresses, symposiums and conference proceedings : Unpublished conference
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/10705

Title :	N-Gram Based Test Sequence Generation from Finite State Models
Language :	English
Author, co-author :	Tonella, Paolo [Fondazione Bruno Kessler - FBK]
	Tiella, Roberto [Fondazione Bruno Kessler - FBK]
	Nguyen, Duy Cu [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Publication date :	10-Nov-2013
Number of pages :	16
Peer reviewed :	Yes
Event name :	1st Future Internet Testing - FITTEST workshop
Event date :	10/11/2013
Permalink :	http://hdl.handle.net/10993/10705
Framework Programme / European Project :	FP7 ; 257574 - FITTEST - Future Internet Testing

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