Login
EN
[EN] English
[FR] Français
Login
EN
[EN] English
[FR] Français
Give us feedback
Search and explore
Search
Explore ORBilu
Open Science
Open Science
Open Access
Research Data Management
Definitions
OS Working group
Webinars
Statistics
Help
User Guide
FAQ
Publication list
Document types
Reporting
Training
ORCID
About
About ORBilu
Deposit Mandate
ORBilu team
Impact and visibility
About statistics
About metrics
OAI-PMH
Project history
Legal Information
Data protection
Legal notices
Back
Home
Detailed Reference
Download
Article (Scientific journals)
Real-Time Distance-Dependent Mapping for a Hybrid ToF Multi-Camera Rig
GARCIA BECERRO, Frederic
;
AOUADA, Djamila
;
Mirbach, Bruno
et al.
2012
•
In
IEEE Journal of Selected Topics in Signal Processing, 6
(5), p. 1-12
Peer Reviewed verified by ORBi
Permalink
https://hdl.handle.net/10993/10620
DOI
10.1109/JSTSP.2012.2207090
Files (1)
Send to
Details
Statistics
Bibliography
Similar publications
Files
Full Text
GARCIA_Frederic_JSTPSP2011.pdf
Author postprint (6.2 MB)
Download
All documents in ORBilu are protected by a
user license
.
Send to
RIS
BibTex
APA
Chicago
Permalink
X
Linkedin
copy to clipboard
copied
Details
Keywords :
data matching; mapping; multimodal sensors; multi-sensor systems; sensor fusion; time of flight (ToF); 3D data; fusion
Disciplines :
Electrical & electronics engineering
Computer science
Identifiers :
UNILU:UL-ARTICLE-2012-672
Author, co-author :
GARCIA BECERRO, Frederic
;
University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SnT)
AOUADA, Djamila
;
University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Mirbach, Bruno;
IEE S.A., Luxembourg
OTTERSTEN, Björn
;
University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Language :
English
Title :
Real-Time Distance-Dependent Mapping for a Hybrid ToF Multi-Camera Rig
Publication date :
2012
Journal title :
IEEE Journal of Selected Topics in Signal Processing
ISSN :
1932-4553
eISSN :
1941-0484
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), New York, United States - New York
Volume :
6
Issue :
5
Pages :
1-12
Peer reviewed :
Peer Reviewed verified by ORBi
Additional URL :
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6231641&isnumber=6265371
Available on ORBilu :
since 12 November 2013
Statistics
Number of views
277 (7 by Unilu)
Number of downloads
410 (5 by Unilu)
More statistics
Scopus citations
®
16
Scopus citations
®
without self-citations
13
OpenAlex citations
15
WoS citations
™
14
Bibliography
Similar publications
Contact ORBilu