Reference : Spatially resolved raman spectroscopy of single- and few-layer graphene
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Spatially resolved raman spectroscopy of single- and few-layer graphene
Graf, D. [ETH Zurich > Solid State Physics Laboratory]
Molitor, F. [ETH Zurich > Solid State Physics Laboratory]
Ensslin, K. [ETH Zurich > Solid State Laboratory]
Stampfer, C. [ETH Zurich > Micro and Nanosystems]
Jungen, A. [ETH Zurich > Micro and Nanosystems]
Hierold, C. [ETH Zurich > Micro and Nanosystems]
Wirtz, Ludger mailto [CNRS-UMR 8520 > Institute for Electronics, Microelectronics, and Nanotechnology]
Nano Letters
American Chemical Society
Yes (verified by ORBilu)
[en] We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.

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