Tian, H., Liu, K., Li, Y., Kabore, A. K., Koyuncu, A., Habib, A., Li, L., Wen, J., Klein, J., & Bissyande, T. F. D. A. (2022). The Best of Both Worlds: Combining Learned Embeddings with Engineered Features for Accurate Prediction of Correct Patches. ACM Transactions on Software Engineering and Methodology. Peer reviewed |
Kui, L., Li, L., Koyuncu, A., Dongsun, K., Liu, Z., Klein, J., & Bissyande, T. F. D. A. (2021). A critical review on the evaluation of automated program repair systems. Journal of Systems and Software. doi:10.1016/j.jss.2020.110817 Peer Reviewed verified by ORBi |
Koyuncu, A. (2020). Boosting Automated Program Repair for Adoption By Practitioners [Doctoral thesis, Unilu - University of Luxembourg]. ORBilu-University of Luxembourg. https://orbilu.uni.lu/handle/10993/45073 |
Liu, K., Wang, S., Koyuncu, A., Kim, K., Bissyande, T. F. D. A., Kim, D., Wu, P., Klein, J., Mao, X., & Le Traon, Y. (2020). On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs. In 42nd ACM/IEEE International Conference on Software Engineering (ICSE). doi:10.1145/3377811.3380338 Peer reviewed |
Koyuncu, A., Liu, K., Bissyande, T. F. D. A., Kim, D., Klein, J., Monperrus, M., & Le Traon, Y. (2020). FixMiner: Mining relevant fix patterns for automated program repair. Empirical Software Engineering. doi:10.1007/s10664-019-09780-z Peer Reviewed verified by ORBi |
Tian, H., Liu, K., Kabore, A. K., Koyuncu, A., Li, L., Klein, J., & Bissyande, T. F. D. A. (2020). Evaluating Representation Learning of Code Changes for Predicting Patch Correctness in Program Repair. In H. Tian, 35th IEEE/ACM International Conference on Automated Software Engineering, September 21-25, 2020, Melbourne, Australia. doi:10.1145/3324884.3416532 Peer reviewed |
Koyuncu, A., Liu, K., Bissyande, T. F. D. A., Kim, D., Monperrus, M., Klein, J., & Le Traon, Y. (2019). iFixR: bug report driven program repair. In ESEC/FSE 2019 Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering. doi:10.1145/3338906.3338935 Peer reviewed |
Liu, K., Koyuncu, A., Kim, D., & Bissyande, T. F. D. A. (2019). TBar: Revisiting Template-based Automated Program Repair. In 28th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA). doi:10.1145/3293882.3330577 Peer reviewed |
Liu, K., Kim, D., Bissyande, T. F. D. A., Kim, T., Kim, K., Koyuncu, A., Kim, S., & Le Traon, Y. (2019). Learning to Spot and Refactor Inconsistent Method Names. In 41st ACM/IEEE International Conference on Software Engineering (ICSE). Montreal, Canada: IEEE. Peer reviewed |
Liu, K., Koyuncu, A., Bissyande, T. F. D. A., Kim, D., Klein, J., & Le Traon, Y. (2019). You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems. In The 12th IEEE International Conference on Software Testing, Verification and Validation (ICST-2019). Xi'an, China: IEEE. doi:10.1109/ICST.2019.00020 Peer reviewed |
Liu, K., Koyuncu, A., Dongsun, K., & Bissyande, T. F. D. A. (2019). AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations. In The 26th IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER-2019). Hangzhou, China: IEEE. doi:10.1109/SANER.2019.8667970 Peer reviewed |
Liu, K., Koyuncu, A., Kim, K., Kim, D., & Bissyande, T. F. D. A. (2018). LSRepair: Live Search of Fix Ingredients for Automated Program Repair. In 25th Asia-Pacific Software Engineering Conference (APSEC). Peer reviewed |
Liu, K., Kim, D., Koyuncu, A., Li, L., Bissyande, T. F. D. A., & Le Traon, Y. (2018). A Closer Look at Real-World Patches. In 34th IEEE International Conference on Software Maintenance and Evolution (ICSME). doi:10.1109/ICSME.2018.00037 Peer reviewed |
Koyuncu, A., Bissyande, T. F. D. A., Kim, D., Klein, J., Monperrus, M., & Le Traon, Y. (July 2017). Impact of Tool Support in Patch Construction [Paper presentation]. 2017 International Symposium on Software Testing & Analysis (ISSTA). doi:10.1145/3092703.3092713 |