Profil

LIU Kui

Main Referenced Co-authors
BISSYANDE, Tegawendé  (13)
KOYUNCU, Anil  (10)
Kim, Dongsun (7)
LE TRAON, Yves  (7)
KLEIN, Jacques  (6)
Main Referenced Keywords
Program repair (5); fix pattern (3); Automated program repair (2); Empirical assessment (2); fault localization (2);
Main Referenced Unit & Research Centers
Interdisciplinary Centre for Security, Reliability and Trust (SnT) > Security Design and Validation Research Group (SerVal) (9)
Main Referenced Disciplines
Computer science (14)

Publications (total 14)

The most downloaded
2239 downloads
Kong, P., Li, L., Gao, J., Liu, K., Bissyande, T. F. D. A., & Klein, J. (2018). Automated Testing of Android Apps: A Systematic Literature Review. IEEE Transactions on Reliability, 1-22. doi:10.1109/TR.2018.2865733 https://hdl.handle.net/10993/36765

The most cited

147 citations (Scopus®)

Liu, K., Koyuncu, A., Kim, D., & Bissyande, T. F. D. A. (2019). TBar: Revisiting Template-based Automated Program Repair. In 28th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA). doi:10.1145/3293882.3330577 https://hdl.handle.net/10993/39778

Qin, Y., Wang, S., Liu, K., Mao, X., & Bissyande, T. F. D. A. (2021). On the Impact of Flaky Tests in Automated Program Repair. In 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, Hawaii 9-12 March 2021 (pp. 295-306). doi:10.1109/SANER50967.2021.00035
Peer reviewed

Liu, K., Wang, S., Koyuncu, A., Kim, K., Bissyande, T. F. D. A., Kim, D., Wu, P., Klein, J., Mao, X., & Le Traon, Y. (2020). On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs. In 42nd ACM/IEEE International Conference on Software Engineering (ICSE). doi:10.1145/3377811.3380338
Peer reviewed

Koyuncu, A., Liu, K., Bissyande, T. F. D. A., Kim, D., Klein, J., Monperrus, M., & Le Traon, Y. (2020). FixMiner: Mining relevant fix patterns for automated program repair. Empirical Software Engineering. doi:10.1007/s10664-019-09780-z
Peer Reviewed verified by ORBi

Tian, H., Liu, K., Kabore, A. K., Koyuncu, A., Li, L., Klein, J., & Bissyande, T. F. D. A. (2020). Evaluating Representation Learning of Code Changes for Predicting Patch Correctness in Program Repair. In H. Tian, 35th IEEE/ACM International Conference on Automated Software Engineering, September 21-25, 2020, Melbourne, Australia. doi:10.1145/3324884.3416532
Peer reviewed

Liu, K. (2019). Deep Pattern Mining for Program Repair [Doctoral thesis, Unilu - University of Luxembourg]. ORBilu-University of Luxembourg. https://orbilu.uni.lu/handle/10993/41348

Koyuncu, A., Liu, K., Bissyande, T. F. D. A., Kim, D., Monperrus, M., Klein, J., & Le Traon, Y. (2019). iFixR: bug report driven program repair. In ESEC/FSE 2019 Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering. doi:10.1145/3338906.3338935
Peer reviewed

Liu, K., Koyuncu, A., Kim, D., & Bissyande, T. F. D. A. (2019). TBar: Revisiting Template-based Automated Program Repair. In 28th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA). doi:10.1145/3293882.3330577
Peer reviewed

Liu, K., Kim, D., Bissyande, T. F. D. A., Kim, T., Kim, K., Koyuncu, A., Kim, S., & Le Traon, Y. (2019). Learning to Spot and Refactor Inconsistent Method Names. In 41st ACM/IEEE International Conference on Software Engineering (ICSE). Montreal, Canada: IEEE.
Peer reviewed

Liu, K., Koyuncu, A., Bissyande, T. F. D. A., Kim, D., Klein, J., & Le Traon, Y. (2019). You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems. In The 12th IEEE International Conference on Software Testing, Verification and Validation (ICST-2019). Xi'an, China: IEEE. doi:10.1109/ICST.2019.00020
Peer reviewed

Liu, K., Koyuncu, A., Dongsun, K., & Bissyande, T. F. D. A. (2019). AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations. In The 26th IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER-2019). Hangzhou, China: IEEE. doi:10.1109/SANER.2019.8667970
Peer reviewed

Liu, K., Koyuncu, A., Kim, K., Kim, D., & Bissyande, T. F. D. A. (2018). LSRepair: Live Search of Fix Ingredients for Automated Program Repair. In 25th Asia-Pacific Software Engineering Conference (APSEC).
Peer reviewed

Kong, P., Li, L., Gao, J., Liu, K., Bissyande, T. F. D. A., & Klein, J. (2018). Automated Testing of Android Apps: A Systematic Literature Review. IEEE Transactions on Reliability, 1-22. doi:10.1109/TR.2018.2865733
Peer Reviewed verified by ORBi

Liu, K., Kim, D., Koyuncu, A., Li, L., Bissyande, T. F. D. A., & Le Traon, Y. (2018). A Closer Look at Real-World Patches. In 34th IEEE International Conference on Software Maintenance and Evolution (ICSME). doi:10.1109/ICSME.2018.00037
Peer reviewed

Liu, K., Kim, D., Bissyande, T. F. D. A., Yoo, S., & Le Traon, Y. (2018). Mining Fix Patterns for FindBugs Violations. IEEE Transactions on Software Engineering. doi:10.1109/TSE.2018.2884955
Peer reviewed

Contact ORBilu