Flakify: A Black-Box, Language Model-Based Predictor for Flaky Tests

Reference : Flakify: A Black-Box, Language Model-Based Predictor for Flaky Tests


	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Computer science
	Focus Areas :	Security, Reliability and Trust
	To cite this reference:	http://hdl.handle.net/10993/53818

Title :	Flakify: A Black-Box, Language Model-Based Predictor for Flaky Tests
Language :	English
Author, co-author :	Fatima, Sakina [University of Ottawa]
	Ghaleb, Taher [University of Ottawa]
	Briand, Lionel [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > SVV >]
Publication date :	In press
Journal title :	IEEE Transactions on Software Engineering
Publisher :	Institute of Electrical and Electronics Engineers
Peer reviewed :	Yes
Audience :	International
ISSN :	0098-5589
e-ISSN :	1939-3520
City :	New-York
Country :	United States - New York
Permalink :	http://hdl.handle.net/10993/53818

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Open access	2112.12331v2.pdf		Publisher postprint	4.22 MB	View/Open

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