Paper published in a journal (Scientific congresses, symposiums and conference proceedings)
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Perrouin, Gilles; Sen, Sagar; Klein, Jacques et al.
2010In International Conference on Software Test and Validation
Peer reviewed
 

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Disciplines :
Computer science
Identifiers :
UNILU:UL-CONFERENCE-2010-394
Author, co-author :
Perrouin, Gilles ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Sen, Sagar;  IRISA/INRIA Rennes, France /Triskell
Klein, Jacques ;  ISC Department, CRP Gabriel Lippmann, Luxembourg
Baudry, Benoit;  IRISA/INRIA Rennes, France /Triskell
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Language :
English
Title :
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Publication date :
2010
Event name :
ICST 2010
Event place :
Paris, France
Event date :
from 6-04-2010 to 10-04-2010
Audience :
International
Journal title :
International Conference on Software Test and Validation
Publisher :
IEEE Computer Society
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 17 August 2013

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