Carrier recombination mechanism and photovoltage deficit in 1.7-eV band gap near-stoichiometric Cu(In,Ga)S2

Shukla, Sudhanshu; Adeleye, Damilola; Sood, Mohit; Ehre, Florian; Lomuscio, Alberto; Weiss, Thomas; Siopa, Daniel; Melchiorre, Michele; Siebentritt, Susanne

doi:10.1103/PhysRevMaterials.5.055403

Reference : Carrier recombination mechanism and photovoltage deficit in 1.7-eV band gap near-stoi...


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/47549

Title :	Carrier recombination mechanism and photovoltage deficit in 1.7-eV band gap near-stoichiometric Cu(In,Ga)S2
Language :	English
Author, co-author :	Shukla, Sudhanshu [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Adeleye, Damilola [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Sood, Mohit [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Ehre, Florian [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Lomuscio, Alberto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Weiss, Thomas [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Siopa, Daniel [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Melchiorre, Michele [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Publication date :	21-May-2021
Journal title :	Physical Review Materials
Publisher :	American Physical Society (APS)
Volume :	5
Peer reviewed :	Yes (verified by ORBi^lu)
Audience :	International
e-ISSN :	2475-9953
City :	New York
Country :	NY
Permalink :	http://hdl.handle.net/10993/47549
DOI :	10.1103/PhysRevMaterials.5.055403

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