Energy harvesting; Power beacon; wireless sensor networks (WSNs); physical-layer security; randomize-and-forward (RF); multi-hop multi-path networks; path selection; hardware impairments; outage probability
Abstract :
[en] Energy-harvesting-based physical layer security
(PLS) has become a promising technique, as it not only secures
information from eavesdropping without upper layer data encryption,
but it also improves the energy efficiency of wireless
networks. However, it imposes new challenges, as adversary
parties can overhear the transmission of confidential information
between the source and destination via a relay. Therefore, the
transmit power of the signals must be large enough for energy
harvesting, but it must also be small enough to avoid eavesdropping.
This is even more challenging with multi-hop multi-path
wireless networks. Motivated by these observations, this paper
proposes three innovative protocols, namely, the shortest path
selection (SPS) protocol, random path selection (RPS) protocol,
and best path selection (BPS) protocol. These will enhance the
security of multi-hop multi-path randomize-and-forward (RF)
cooperative wireless sensor networks (WSNs) under the presence
of eavesdroppers and hardware impairment, wherein the source
node and relay nodes are capable of harvesting energy from
beacon for data transmission. Furthermore, we derive exact
closed-form expressions and the asymptotic outage probability
for each protocol under multiple eavesdropping attacks. The
simulation results validate the theoretical results.
Research center :
Hongik University
Disciplines :
Computer science
Author, co-author :
Tran Dinh, Hieu ; University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Tran, Trung Duy
Kim, Bung-Seo
External co-authors :
yes
Language :
English
Title :
Performance Enhancement for Multihop Harvest-to-Transmit WSNs With Path-Selection Methods in Presence of Eavesdroppers and Hardware Noises
Publication date :
15 June 2018
Journal title :
IEEE Sensors Journal
ISSN :
1558-1748
Publisher :
Institute of Electrical and Electronics Engineers, New York, United States - New York