Article (Scientific journals)
Dependability Assessment of the Android OS Through Fault Injection
Iannillo, Antonio Ken; Cotroneo, Domenico; Natella, Roberto et al.
2019In IEEE Transaction on Reliability
Peer reviewed
 

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Keywords :
android OS; dependability; fault injection
Abstract :
[en] The reliability of mobile devices is a challenge for vendors since the mobile software stack has significantly grown in complexity. In this article, we study how to assess the impact of faults on the quality of user experience in the Android mobile OS through fault injection. We first address the problem of identifying a realistic fault model for the Android OS, by providing developers a set of lightweight and systematic guidelines for fault modeling. Then, we present an extensible fault injection tool (AndroFIT) to apply such fault model on actual, commercial Android devices. Finally, we present a large fault injection experimentation on three Android products from major vendors and point out several reliability issues and opportunities for improving the Android OS.
Disciplines :
Computer science
Author, co-author :
Iannillo, Antonio Ken ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Cotroneo, Domenico
Natella, Roberto
Rosiello, Stefano
External co-authors :
yes
Language :
English
Title :
Dependability Assessment of the Android OS Through Fault Injection
Publication date :
05 December 2019
Journal title :
IEEE Transaction on Reliability
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
Available on ORBilu :
since 06 December 2019

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