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MOORS Kristof

Main Referenced Co-authors
Adelmann, Christoph (2)
Dutta, Shibesh (2)
Magnus, Wim (2)
SCHMIDT, Thomas  (2)
Sorée, Bart (2)
Main Referenced Keywords
Grain boundaries (2); Surface scattering (2); Thin films (2); Ab initio calculations (1); Boltzmann equation (1);
Main Referenced Disciplines
Physics (7)

Publications (total 7)

The most downloaded
2 downloads
Miceli, D., Zsurka, E., LEGENDRE, J., MOORS, K., SCHMIDT, T., & Serra, L. (31 July 2023). Conductance asymmetry in proximitized magnetic topological insulator junctions with Majorana modes. Physical Review. B, 108 (3). doi:10.1103/PhysRevB.108.035424 https://hdl.handle.net/10993/57539

The most cited

131 citations (Scopus®)

Dutta, S., Sankaran, K., Moors, K., Pourtois, G., Van Elshocht, S., Bömmels, J., Vandervorst, W., Tokei, Z., & Adelmann, C. (2017). Thickness dependence of the resistivity of platinum-group metal thin films. Journal of Applied Physics, 122 (2). doi:10.1063/1.4992089 https://hdl.handle.net/10993/33813

Miceli, D., Zsurka, E., LEGENDRE, J., MOORS, K., SCHMIDT, T., & Serra, L. (31 July 2023). Conductance asymmetry in proximitized magnetic topological insulator junctions with Majorana modes. Physical Review. B, 108 (3). doi:10.1103/PhysRevB.108.035424
Peer Reviewed verified by ORBi

Moors, K., Contino, A., Van de Put, M. L., Vandenberghe, W. G., Fischetti, M. V., Magnus, W., & Sorée, B. (06 February 2019). Theoretical study of scattering in graphene ribbons in the presence of structural and atomistic edge roughness. Physical Review Materials, 3 (2), 024001. doi:10.1103/PhysRevMaterials.3.024001
Peer Reviewed verified by ORBi

Dutta, S., Moors, K., Vandemaele, M., & Adelmann, C. (2018). Finite Size Effects in Highly Scaled Ruthenium Interconnects. IEEE Electron Device Letters. doi:10.1109/LED.2017.2709248
Peer reviewed

Moors, K., Schüffelgen, P., Rosenbach, D., Schmitt, T., Schäpers, T., & Schmidt, T. (2018). Magnetotransport signatures of three-dimensional topological insulator nanostructures. Physical Review. B, 97 (24), 245429. doi:10.1103/PhysRevB.97.245429
Peer Reviewed verified by ORBi

De Clercq, M., Moors, K., Sankaran, K., Pourtois, G., Dutta, S., Adelmann, C., Magnus, W., & Sorée, B. (2018). Resistivity scaling model for metals with conduction band anisotropy. Physical Review Materials, 2 (3), 033801. doi:10.1103/PhysRevMaterials.2.033801
Peer reviewed

Dutta, S., Sankaran, K., Moors, K., Pourtois, G., Van Elshocht, S., Bömmels, J., Vandervorst, W., Tokei, Z., & Adelmann, C. (2017). Thickness dependence of the resistivity of platinum-group metal thin films. Journal of Applied Physics, 122 (2). doi:10.1063/1.4992089
Peer reviewed

Moors, K., Sorée, B., & Magnus, W. (2017). Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering. Microelectronic Engineering, 167, 37-41. doi:10.1016/j.mee.2016.10.015
Peer Reviewed verified by ORBi

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