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Low Current Dispersion and Low Bias-stress Degradation of Unpassivated GaN/AlGaN/GaN/SiC HEMTs

Bernát, J.; Pierobon, R.; Marso, Michel et al.

2005 • In Physica Status Solidi C. Current Topics in Solid State Physics, 2 (7), p. 2676-2679

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