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Performance of unpassivated AlGaN/GaN/SiC HEMTs after short-term electrical bias stress
Bernát, J.; Wolter, M.; Javorka, P. et al.
2004 • In Solid-State Electronics, 48 ((2004)), p. 1825-1828

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110_SSE_48_2004_1825_1828.pdf

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