Reference : Empirical Evaluation of Mutation-based Test Prioritization Techniques

	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/37485

Title :	Empirical Evaluation of Mutation-based Test Prioritization Techniques
Language :	English
Author, co-author :	Shin, Donghwan []
	Yoo, Shin []
	Papadakis, Mike [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > Computer Science and Communications Research Unit (CSC) >]
	Bae, Doo-Hwan []
Publication date :	2019
Journal title :	Software Testing, Verification and Reliability
Publisher :	John Wiley & Sons
Volume :	29
Issue/season :	1-2
Special issue title :	Special issue on mutation testing and analysis.
Peer reviewed :	Yes (verified by ORBilu)
Audience :	International
ISSN :	0960-0833
e-ISSN :	1099-1689
City :	Hoboken
Country :	NJ
Permalink :	http://hdl.handle.net/10993/37485

	File(s) associated to this reference
	Fulltext file(s): File Commentary Version Size Access Open access STVR18.pdf Publisher postprint 1.01 MB View/Open

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