References of "Physical Chemistry Chemical Physics [=PCCP]"
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See detailStructural and electronic properties of CuSbS2 and CuBiS2: potential absorber materials for thin-film solar cells
Dufton, Jesse T.R.; Walsh, Aron; Panchmatia, Pooja M. et al

in Physical Chemistry Chemical Physics [=PCCP] (2012), 14(20), 7229-7233

As the demand for photovoltaics rapidly increases, there is a pressing need for the identification of new visible light absorbing materials for thin-film solar cells that offer similar performance to the ... [more ▼]

As the demand for photovoltaics rapidly increases, there is a pressing need for the identification of new visible light absorbing materials for thin-film solar cells that offer similar performance to the current technologies based on CdTe and Cu(In,Ga)Se2. Metal sulphides are the ideal candidate materials, but their band gaps are usually too large to absorb significant fractions of visible light. However, by combining Cu+ (low binding energy d10 band) and Sb3+/Bi3+ (low binding energy s2 band), the ternary sulphides CuSbS2 and CuBiS2 are formed, which have been gathering recent interest for solar cell applications. Using a hybrid density functional theory approach, we calculate the structural and electronic properties of these two materials. Our results highlight the stereochemical activity of the Sb and Bi lone pair electrons, and predict that the formation of hole carriers will occur in the Cu d10 band and hence will involve oxidation of Cu(I). [less ▲]

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See detailLocal chemical composition of nanophase-separated polymer brushes
Filimon, Marlena UL; Kopf, Ilona; Bründermann, Erik et al

in Physical Chemistry Chemical Physics [=PCCP] (2011)

Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene–poly(methyl methacrylate) (PS–PMMA) brushes and investigated changes in ... [more ▼]

Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene–poly(methyl methacrylate) (PS–PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to top layers dominated by PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm . [less ▲]

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See detailControlled electrodeposition of Cu-Ga from a deep eutectic solvent for low cost fabrication of CuGaSe2 thin film solar cells
Steichen, Marc UL; Thomassey, Matthieu UL; Siebentritt, Susanne UL et al

in Physical Chemistry Chemical Physics [=PCCP] (2011), 13(10), 4292-4302

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