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See detailEffects of Annealing and Light on Co-evaporated Methylammonium Lead Iodide Perovskites using Kelvin Probe Force Microscopy in Ultra-High Vacuum
Gallet, Thibaut UL; Martin Lanzoni, Evandro UL; Redinger, Alex UL

in 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) (2020, February 06)

Careful surface analysis is essential to understand the electronic and ionic behaviors in perovskite absorbers. In this contribution we discuss Kelvin probe force microscopy performed in ultra-high vacuum ... [more ▼]

Careful surface analysis is essential to understand the electronic and ionic behaviors in perovskite absorbers. In this contribution we discuss Kelvin probe force microscopy performed in ultra-high vacuum on as-grown and annealed co-evaporated methylammonium lead iodide perovskite thin films. By comparing the contact potential difference upon annealing and illumination, we find that annealing increases the average workfunction, indicating a change either in doping or in surface composition. Illumination also increases the average workfunction, indicating a p-type absorber, by reducing band bending as the photo-generated carriers screen the surface states. The effect of light shows a two-step process, with a first fast trend, linked to the surface photovoltage and a second slower trend indicating a possible redistribution of mobile charges. [less ▲]

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