![]() Nourdin, Ivan ![]() ![]() ![]() in Journal of Functional Analysis (2014), 266(5), 3170-3207 Detailed reference viewed: 213 (11 UL)![]() Nourdin, Ivan ![]() ![]() ![]() in Abstract book of 2014 IEEE International Symposium on Information Theory (ISIT) (2014) Detailed reference viewed: 176 (3 UL)![]() ; ; Swan, Yvik ![]() in Bernoulli (2014), 20(2), 775-802 A famous characterization theorem due to C. F. Gauss states that the maximum likelihood estimator (MLE) of the parameter in a location family is the sample mean for all samples of all sample sizes if and ... [more ▼] A famous characterization theorem due to C. F. Gauss states that the maximum likelihood estimator (MLE) of the parameter in a location family is the sample mean for all samples of all sample sizes if and only if the family is Gaussian. There exist many extensions of this result in diverse directions, most of them focussing on location and scale families. In this paper we propose a unified treatment of this literature by providing general MLE characterization theorems for one-parameter group families (with particular attention on location and scale parameters). In doing so we provide tools for determining whether or not a given such family is MLE-characterizable, and, in case it is, we define the fundamental concept of minimal necessary sample size at which a given characterization holds. Many of the cornerstone references on this topic are retrieved and discussed in the light of our findings, and several new characterization theorems are provided. Of particular interest is that one part of our work, namely the introduction of so-called equivalence classes for MLE characterizations, is a modernized version of Daniel Bernoulli's viewpoint on maximum likelihood estimation. [less ▲] Detailed reference viewed: 116 (1 UL)![]() ; Swan, Yvik ![]() E-print/Working paper (2013) Stein operators are differential operators which arise within the so-called Stein's method for stochastic approximation. We propose a new mechanism for constructing such operators for arbitrary ... [more ▼] Stein operators are differential operators which arise within the so-called Stein's method for stochastic approximation. We propose a new mechanism for constructing such operators for arbitrary (continuous or discrete) parametric distributions with continuous dependence on the parameter. We provide explicit general expressions for location, scale and skewness families. We also provide a general expression for discrete distributions. For specific choices of target distributions (including the Gaussian, Gamma and Poisson) we compare the operators hereby obtained with those provided by the classical approaches from the literature on Stein's method. We use properties of our operators to provide upper and lower variance bounds (only lower bounds in the discrete case) on functionals h(X) of random variables X following parametric distributions. These bounds are expressed in terms of the first two moments of the derivatives (or differences) of h. We provide general variance bounds for location, scale and skewness families and apply our bounds to specific examples (namely the Gaussian, exponential, Gamma and Poisson distributions). The results obtained via our techniques are systematically competitive with, and sometimes improve on, the best bounds available in the literature. [less ▲] Detailed reference viewed: 96 (1 UL)![]() ; ; Swan, Yvik ![]() in Brazilian Journal of Probability and Statistics (2013), to appear Detailed reference viewed: 106 (1 UL)![]() ; Swan, Yvik ![]() in Periodica Mathematica Hungarica (2013) Detailed reference viewed: 96 (0 UL)![]() ; Swan, Yvik ![]() E-print/Working paper (2013) We develop Stein's method for the Frechet distribution and apply it to compute rates of convergence in distribution of renormalized sample maxima to the Frechet distribution. Detailed reference viewed: 70 (0 UL)![]() ; Swan, Yvik ![]() in Journal of Econometrics (2013), 172(2), 195--204 Detailed reference viewed: 102 (1 UL)![]() ; Swan, Yvik ![]() in IEEE Transactions on Information Theory (2013), 59(9), 5584-4491 Detailed reference viewed: 100 (0 UL)![]() ; Swan, Yvik ![]() in Statistica Sinica (2013), 23 Detailed reference viewed: 44 (0 UL)![]() ; Swan, Yvik ![]() in Electronic Communications in Probability (2013), 18(7), 1--14 Detailed reference viewed: 138 (0 UL)![]() ; Swan, Yvik ![]() E-print/Working paper (2012) In this paper we tackle the ANOVA problem for directional data (with particular emphasis on geological data) by having recourse to the Le Cam methodology usually reserved for linear multivariate analysis ... [more ▼] In this paper we tackle the ANOVA problem for directional data (with particular emphasis on geological data) by having recourse to the Le Cam methodology usually reserved for linear multivariate analysis. We construct locally and asymptotically most stringent parametric tests for ANOVA for directional data within the class of rotationally symmetric distributions. We turn these parametric tests into semi-parametric ones by (i) using a studentization argument (which leads to what we call pseudo-FvML tests) and by (ii) resorting to the invariance principle (which leads to efficient rank-based tests). Within each construction the semi-parametric tests inherit optimality under a given distribution (the FvML distribution in the first case, any rotationally symmetric distribution in the second) from their parametric antecedents and also improve on the latter by being valid under the whole class of rotationally symmetric distributions. Asymptotic relative efficiencies are calculated and the finite-sample behaviour of the proposed tests is investigated by means of a Monte Carlo simulation. We conclude by applying our findings on a real-data example involving geological data. [less ▲] Detailed reference viewed: 101 (0 UL)![]() ; Swan, Yvik ![]() Report (2012) Detailed reference viewed: 97 (1 UL)![]() ; Swan, Yvik ![]() Report (2011) Detailed reference viewed: 44 (0 UL) |
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