References of "Melchiorre, Michele 50003575"
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See detailInkjet-printed indium sulfide buffer layer for Cu(In,Ga)(S,Se)2 thin film solar cells
Debot, Alice UL; Chu, Van Ben; Adeleye, Damilola UL et al

in Thin Solid Films (2022)

We report an environmentally friendly inkjet-printed indium sulfide (In2S3) buffer layer using benign chemistry and processing conditions. A pre-synthesized indium-thiourea compound is dissolved in a ... [more ▼]

We report an environmentally friendly inkjet-printed indium sulfide (In2S3) buffer layer using benign chemistry and processing conditions. A pre-synthesized indium-thiourea compound is dissolved in a mixture of water and ethanol, inkjet printed on a Cu(In,Ga)(S,Se)2 absorber and annealed in air. The buffer layer shows a β-In2S3 structure with few organic impurities and band gap in the range of 2.3 eV. An ultraviolet ozone treatment applied to the surface of the absorber prior to inkjet printing of the precursor is used to improve the wettability of the ink and therefore the surface coverage of the buffer on the absorber layer. The device with a fully covering In2S3 layer shows better open circuit voltage and fill factor than the device with a partially covering In2S3 layer. The best In2S3 device showed a light to electric power conversion efficiency similar to the reference cadmium sulfide buffer layer device. Good wettability conditions are therefore essential for higher efficiency solar cells when the buffer layer is inkjet-printed. [less ▲]

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See detailDiode Factor in Solar Cells with Metastable Defects and Back Contact Recombination
Wang, Taowen UL; Ehre, Florian UL; Weiss, Thomas UL et al

in Advanced Energy Materials (2022)

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See detailNear surface defects: Cause of deficit between internal and external open-circuit voltage in solar cells
Sood, Mohit UL; Urbanaik, Aleksander; Kameni Boumenou, Christian UL et al

in Progress in Photovoltaics (2021)

Interface recombination in a complex multilayered thin-film solar structure causes a disparity between the internal open-circuit voltage (VOC,in), measured by photoluminescence, and the external open ... [more ▼]

Interface recombination in a complex multilayered thin-film solar structure causes a disparity between the internal open-circuit voltage (VOC,in), measured by photoluminescence, and the external open-circuit voltage (VOC,ex), that is, a VOC deficit. Aspirations to reach higher VOC,ex values require a comprehensive knowledge of the connection between VOC deficit and interface recombination. Here, a near-surface defect model is developed for copper indium di-selenide solar cells grown under Cu-excess conditions. These cell show the typical signatures of interface recombination: a strong disparity between VOC,in and VOC,ex, and extrapolation of the temperature dependent q·VOC,ex to a value below the bandgap energy. Yet, these cells do not suffer from reduced interface bandgap or from Fermi-level pinning. The model presented is based on experimental analysis of admittance and deep-level transient spectroscopy, which show the signature of an acceptor defect. Numerical simulations using the near-surface defects model show the signatures of interface recombination without the need for a reduced interface bandgap or Fermi-level pinning. These findings demonstrate that the VOC,in measurements alone can be inconclusive and might conceal the information on interface recombination pathways, establishing the need for complementary techniques like temperature dependent current–voltage measurements to identify the cause of interface recombination in the devices. [less ▲]

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See detailWaste- and Cd-Free Inkjet-Printed Zn(O,S) Buffer for Cu(In,Ga)(S,Se)2 Thin-Film Solar Cells
Chu, van Ben UL; Siopa, Daniel UL; Debot, Alice UL et al

in ACS Applied Materials and Interfaces (2021), 13

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See detailAbsorber composition: A critical parameter for the effectiveness of heat treatments in chalcopyrite solar cells
Sood, Mohit UL; Elanzeery, Hossam UL; Adeleye, Damilola UL et al

in Progress in Photovoltaics (2020)

Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown ... [more ▼]

Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown under Cu-poor conditions but not under Cu excess.. We present a systematic study to understand the effects of HT on CuInSe2 and CuInS2 solar cells. The study is performed for CuInSe2 solar cells grown under Cu-rich and Cu-poor chemical potential prepared with both CdS and Zn(O,S) buffer layers. In addition, we also study Cu-rich CuInS2 solar cells prepared with the suitable Zn(O,S) buffer layer. For Cu-poor selenide device low-temperature HT leads to passivation of bulk, whereas in Cu-rich devices no such passivation was observed. The Cu-rich devices are hampered by a large shunt. The HT decreases shunt resistance in Cu-rich selenides, whereas it increases shunt resistance in Cu-rich sulfides.. The origin of these changes in device performance was investigated with capacitance-voltage measurement which shows the considerable decrease in carrier concentration with HT in Cu-poor CuInSe2, and temperature dependent current-voltage measurements show the presence of barrier for minority carriers. Together with numerical simulations, these findings support a highly-doped interfacial p+ layer device model in Cu-rich selenide absorbers and explain the discrepancy between Cu-poor and Curich device performance. Our findings provide insights into how the same treatment can have a completely different effect on the device depending on the composition of the absorber. [less ▲]

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See detailPassivation of the CuInSe2 surface via cadmium pre-electrolyte treatment
Kameni Boumenou, Christian UL; Babbe, Finn; Elizabeth, Amala et al

in Physical Review Materials (2020)

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See detailPhonon coupling and shallow defects in CuInS2
Lomuscio, Alberto UL; Sood, Mohit UL; Melchiorre, Michele UL et al

in Physical Review. B (2020), 101(8), 085119-

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See detailSurface characterization of epitaxial Cu-rich CuInSe2 absorbers
Lanzoni, Evandro; Spindler, Conrad UL; Ramirez Sanchez, Omar UL et al

in IEEE (2020)

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See detailChemical instability at chalcogenide surfaces impacts chalcopyrite devices well beyond the surface
Colombara, Diego UL; Elanzeery, Hossam UL; Nicoara, Nicoleta et al

in Nature Communications (2020)

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See detailPhotoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Rey, Germain UL; Paduthol, Appu; Sun, Kaiwen et al

in IEEE Journal of Photovoltaics (2020)

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See detailSurface characterization of epitaxial Cu-rich CuInSe2 absorbers
Martin Lanzoni, Evandro UL; Spindler, Conrad UL; Ramirez Sanchez, Omar UL et al

in IEEE Photovoltaic Specialists Conference. Conference Record (2019, July)

We investigated the electrical properties of epitaxial Cu-rich CuInSe 2 by Kelvin probe force microscopy (KPFM) under ambient and ultra-high vacuum conditions. We first measured the sample under ambient ... [more ▼]

We investigated the electrical properties of epitaxial Cu-rich CuInSe 2 by Kelvin probe force microscopy (KPFM) under ambient and ultra-high vacuum conditions. We first measured the sample under ambient conditions before and after potassium cyanide (KCN) etching. In both cases, we do not see any substantial contrast in the surface potential data; furthermore, after the KCN etching we observed outgrowths with a height around 2nm over the sample surface. On the other hand, the KPFM measurements under ultra-high vacuum conditions show a work function dependence according to the surface orientation of the Cu-rich CuInSe 2 crystal. Our results show the possibility to increase the efficiency of epitaxial Cu-rich CuInSe 2 by growing the materials in the appropriated surface orientation where the variations in work function are reduced. [less ▲]

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See detailQuasi-Fermi-Level Splitting of Cu-Poor and Cu-Rich CuInS2 Absorber Layers
Lomuscio, Alberto UL; Rödel, Tobias UL; Schwarz, Torsten et al

in Physical Review Applied (2019), 11

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See detailChallenge in Cu-rich CuInSe2 thin film solar cells: Defect caused by etching
Elanzeery, Hossam UL; Melchiorre, Michele UL; Sood, Mohit UL et al

in Physical Review Materials (2019), 3

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See detailInfluence of stoichiometry and temperature on quasi Fermi level splitting of sulfide CIS absorber layers
Lomuscio, Alberto UL; Melchiorre, Michele UL; Siebentritt, Susanne UL

in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (2018, November 29)

CuInS-based solar cells suffer from a low open circuit voltage. Absorbers grown under both Cu-excess and Cudeficiency have been used to fabricate record efficiency photovoltaic cells. In this work, we ... [more ▼]

CuInS-based solar cells suffer from a low open circuit voltage. Absorbers grown under both Cu-excess and Cudeficiency have been used to fabricate record efficiency photovoltaic cells. In this work, we present the influence of stoichiometry on the quality of absorbers by means of calibrated room temperature photoluminescence and quasi Fermi level splitting evaluation (qFLs). Deep defects-related photoluminescence decreases using higher Cu/In ratio, leading to a corresponding improvement in qFLs, with values above 900 meV for high copper rich absorbers. © 2018 IEEE. [less ▲]

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