Near surface defects: Cause of deficit between internal and external open-circuit voltage in solar cells

in Progress in Photovoltaics (2021)

Interface recombination in a complex multilayered thin-film solar structure causes a disparity between the internal open-circuit voltage (VOC,in), measured by photoluminescence, and the external open ... [more ▼]

Interface recombination in a complex multilayered thin-film solar structure causes a disparity between the internal open-circuit voltage (VOC,in), measured by photoluminescence, and the external open-circuit voltage (VOC,ex), that is, a VOC deficit. Aspirations to reach higher VOC,ex values require a comprehensive knowledge of the connection between VOC deficit and interface recombination. Here, a near-surface defect model is developed for copper indium di-selenide solar cells grown under Cu-excess conditions. These cell show the typical signatures of interface recombination: a strong disparity between VOC,in and VOC,ex, and extrapolation of the temperature dependent q·VOC,ex to a value below the bandgap energy. Yet, these cells do not suffer from reduced interface bandgap or from Fermi-level pinning. The model presented is based on experimental analysis of admittance and deep-level transient spectroscopy, which show the signature of an acceptor defect. Numerical simulations using the near-surface defects model show the signatures of interface recombination without the need for a reduced interface bandgap or Fermi-level pinning. These findings demonstrate that the VOC,in measurements alone can be inconclusive and might conceal the information on interface recombination pathways, establishing the need for complementary techniques like temperature dependent current–voltage measurements to identify the cause of interface recombination in the devices. [less ▲]

Electronic and compositional properties of the rear-side of stoichiometric CuInSe2 absorbers

in Progress in Photovoltaics (2020)

In-depth understanding and subsequent optimization of the contact layers in thin film solar cells are of high importance in order to reduce the amount of nonradiative recombination and thereby improve ... [more ▼]

In-depth understanding and subsequent optimization of the contact layers in thin film solar cells are of high importance in order to reduce the amount of nonradiative recombination and thereby improve device performance. In this work, the buried MoSe2/CuInSe2 interface of stoichiometric absorbers is investigated with scanning tunneling spectroscopy and Kelvin probe force microscopy combined with compositional measurements acquired via photo-electron spectroscopy after a mechanical lift-off process. We find that the local density of states, as measured with scanning tunneling spectroscopy, is similar to the front-side of ultra-high vacuum annealed CISe absorbers. The grain boundaries exhibit a weak upward band bending, opposite to Cu-poor CuGaSe2, and we measure an increased Cu accumulation at the rear CISe surface compared to the bulk composition and a non-zero concentration of Cu on the Mo-side. Grazing incidence X-ray diffraction measurements corroborate that a small amount of a CuxSe secondary phase is present at the MoSe2/CuInSe2 interface in contrast to reports on Cu-poor material. Our findings shed new light into the complex interface formation of CuInSe2-based thin film solar cells grown under Cu-rich conditions. [less ▲]