References of "Hong, Shin"
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See detailAre Concurrency Coverage Metrics Effective for Testing: A Comprehensive Empirical Investigation
Hong, Shin; Staats, Matthew UL; Ahn, Jaemin et al

in Software Testing, Verification & Reliability (2014)

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See detailThe Impact of Concurrent Coverage Metrics on Testing Effectiveness
Hong, Shin; Staats, Matthew UL; Ahn, Jaemin et al

in The Impact of Concurrent Coverage Metrics on Testing Effectiveness. (2013)

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See detailUnderstanding user understanding: determining correctness of generated program invariants
Staats, Matthew UL; Hong, Shin; Kim, Moonzoo et al

in ISSTA (2012)

Detailed reference viewed: 59 (4 UL)