References of "Bae, Doo-Hwan"
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See detailEmpirical Evaluation of Mutation-based Test Prioritization Techniques
Shin, Donghwan; Yoo, Shin; Papadakis, Mike UL et al

in Software Testing, Verification and Reliability (in press)

Detailed reference viewed: 75 (4 UL)
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See detailAre Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Papadakis, Mike UL; Shin, Donghwan; Yoo, Shin et al

in 40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden (2018)

Detailed reference viewed: 175 (5 UL)