References of "Papadakis, Mike 50002811"
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See detailAssessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Henard, Christopher UL; Papadakis, Mike UL; Perrouin, Gilles UL et al

in 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013 (2013)

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See detailProteum/FL: A tool for localizing faults using mutation analysis.
Papadakis, Mike UL; Delamaro, Eduardo Márcio; Le Traon, Yves UL

in International Working Conference on Source Code Analysis and Manipulation (2013)

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See detailMulti-objective test generation for software product lines
Henard, Christopher UL; Papadakis, Mike UL; Perrouin, Gilles UL et al

in 17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013 (2013)

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See detailPLEDGE: a product line editor and test generation tool
Henard, Christopher UL; Papadakis, Mike UL; Perrouin, Gilles UL et al

in 17th International Software Product Line Conference co-located workshops, SPLC 2013 workshops, Tokyo, Japan - August 26 (2013)

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See detailMutation Testing Strategies using Mutant Classification
Papadakis, Mike UL; Le Traon, Yves UL

in Abstract book of 28th Symposium On Applied Computing (2013)

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See detailIsolating First Order Equivalent Mutants via Second Order Mutation.
Kintis, Marinos; Papadakis, Mike UL; Malevris, Nicos

in ICST 2012 (2012)

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See detailMutation Based Test Case Generation via a Path Selection Strategy
Papadakis, Mike UL; Malevris, Nicos

in Information & Software Technology (2012), 54(9), 915-932

Context: Generally, mutation analysis has been identified as a powerful testing method. Researchers have shown that its use as a testing criterion exercises quite thoroughly the system under test while it ... [more ▼]

Context: Generally, mutation analysis has been identified as a powerful testing method. Researchers have shown that its use as a testing criterion exercises quite thoroughly the system under test while it achieves to reveal more faults than standard structural testing criteria. Despite its potential, mutation fails to be adopted in a widespread practical use and its popularity falls significantly short when compared with other structural methods. This can be attributed to the lack of thorough studies dealing with the practical problems introduced by mutation and the assessment of the effort needed when applying it. Such an incident, masks the real cost involved preventing the development of easy and effective to use strategies to circumvent this problem. Objective: In this paper, a path selection strategy for selecting test cases able to effectively kill mutants when performing weak mutation testing is presented and analysed. Method: The testing effort is highly correlated with the number of attempts the tester makes in order to generate adequate test cases. Therefore, a significant influence on the efficiency associated with a test case generation strategy greatly depends on the number of candidate paths selected in order to achieve a predefined coverage goal. The effort can thus be related to the number of infeasible paths encountered during the test case generation process. Results: An experiment, investigating well over 55 million of program paths is conducted based on a strategy that alleviates the effects of infeasible paths. Strategy details, along with a prototype implementation are reported and analysed through the experimental results obtained by its employment to a set of program units. Conclusion: The results obtained suggest that the strategy used can play an important role in making the mutation testing method more appealing and practical. [less ▲]

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See detailBypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Henard, Christopher UL; Papadakis, Mike UL; Perrouin, Gilles UL et al

Report (2012)

Software Product Lines (SPLs) are families of products whose commonalities and variability can be captured by Feature Models (FMs). T-wise testing aims at finding errors triggered by all interactions ... [more ▼]

Software Product Lines (SPLs) are families of products whose commonalities and variability can be captured by Feature Models (FMs). T-wise testing aims at finding errors triggered by all interactions amongst t features, thus reducing drastically the number of products to test. T-wise testing approaches for SPLs are limited to small values of t -- which miss faulty interactions -- or limited by the size of the FM. Furthermore, they neither prioritize the products to test nor provide means to finely control the generation process. This paper offers (a) a search-based approach capable of generating products for large SPLs, forming a scalable and flexible alternative to current techniques and (b) prioritization algorithms for any set of products. Experiments conducted on 124 FMs (including large FMs such as the Linux kernel) demonstrate the feasibility and the practicality of our approach. [less ▲]

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See detailUsing Mutants to Locate "Unknown" Faults
Papadakis, Mike UL; Le Traon, Yves UL

in ICST 2012 (2012)

Detailed reference viewed: 139 (2 UL)