References of "Grysan, P."
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See detailLow-Temperature Growth of AlN Films on Magnetostrictive Foils for High-Magnetoelectric-Response Thin-Film Composites
Nguyen, T.; Fleming, Y.; Bender, P. et al

in ACS Applied Materials and Interfaces (2021), 13

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See detailResolving Inclusion Structure and Deformation Mechanisms in Polylactide Plasticized by Reactive Extrusion
Bruster, Berit; Amozoqueno, Camilo; Grysan, P. et al

in Macromolecular Materials and Engineering (2017)

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See detailLow energy electron imaging of domains and domain walls in magnesium-doped lithium niobate
Nataf, G. F.; Grysan, P.; Guennou, Mael UL et al

in SCIENTIFIC REPORTS (2016), 6

The understanding of domain structures, specifically domain walls currently attracts a significant attention in the field of (multi)-ferroic materials. In this article, we analyze contrast formation in ... [more ▼]

The understanding of domain structures, specifically domain walls currently attracts a significant attention in the field of (multi)-ferroic materials. In this article, we analyze contrast formation in full field electron microscopy applied to domains and domain walls in the uniaxial ferroelectric lithium niobate, which presents a large 3.8 eV band gap and for which conductive domain walls have been reported. We show that the transition from Mirror Electron Microscopy (MEM - electrons reflected) to Low Energy Electron Microscopy (LEEM - electrons backscattered) gives rise to a robust contrast between domains with upwards (P-up) and downwards (P-down) polarization, and provides a measure of the difference in surface potential between the domains. We demonstrate that out-of-focus conditions of imaging produce contrast inversion, due to image distortion induced by charged surfaces and also carry information on the polarization direction in the domains. Finally, we show that the intensity profile at domain walls provides experimental evidence for a local stray, lateral electric field. [less ▲]

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