References of "Bae, Doo-Hwan"
Bookmark and Share    
Full Text
Peer Reviewed
See detailEmpirical Evaluation of Mutation-based Test Prioritization Techniques
Shin, Donghwan; Yoo, Shin; Papadakis, Mike UL et al

in Software Testing, Verification and Reliability (2019), 29(1-2),

Detailed reference viewed: 108 (9 UL)
Full Text
Peer Reviewed
See detailAre Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Papadakis, Mike UL; Shin, Donghwan; Yoo, Shin et al

in 40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden (2018)

Detailed reference viewed: 215 (8 UL)