Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing

Reference : Assessing Software Product Line Testing Via Model-Based Mutation: An Application to S...


	Document type :	Scientific congresses, symposiums and conference proceedings : Paper published in a book
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/9916

Title :	Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Language :	English
Author, co-author :	Henard, Christopher [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
	Papadakis, Mike [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
	Perrouin, Gilles [> >]
	Klein, Jacques [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
	Le Traon, Yves [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Publication date :	2013
Main document title :	2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013
Publisher :	IEEE
Collection and collection volume :	ICST Workshops 2013
Peer reviewed :	Yes
Audience :	International
ISBN :	978-1-4799-1324-4
Event name :	A-MOST Workshop, ICST
Event date :	March 2013
Event country :	Luxembourg, Luxembourg
Permalink :	http://hdl.handle.net/10993/9916
Other URL :	http://www.computer.org/csdl/proceedings/icstw/2013/4993/00/4993a188-abs.html

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