Reference : Assessing Software Product Line Testing Via Model-Based Mutation: An Application to S...
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/9916
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
English
Henard, Christopher mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Papadakis, Mike mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Perrouin, Gilles [> >]
Klein, Jacques mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Le Traon, Yves mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
2013
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013
IEEE
ICST Workshops 2013
Yes
International
978-1-4799-1324-4
A-MOST Workshop, ICST
March 2013
Luxembourg, Luxembourg
http://hdl.handle.net/10993/9916
http://www.computer.org/csdl/proceedings/icstw/2013/4993/00/4993a188-abs.html

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