Reference : Selective Test Generation Method for Evolving Critical Systems
Scientific congresses, symposiums and conference proceedings : Paper published in a journal
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/9796
Selective Test Generation Method for Evolving Critical Systems
English
Fourneret, Elizabeta mailto [LIFC INRIA CASSIS Project, Univ. de Franche-Comte, Besancon, France]
Bouquet, Fabrice [> >]
Dadeau, Frédéric [> >]
Debricon, Stéphane [> >]
2011
Proceedings of 4th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW 2011)
IEEE Computer Society
125-134
Yes
International
IEEE International Conference on Software Testing, Verification and Validation
from 21-03-2011 to 25-03-2011
[en] Dependence Analysis ; Evolution ; Model-Based Testing ; Regression ; Stagnation ; Tests life cycle
[en] We present in this paper the implementation of a model-based testing technique for evolving systems. These latters are described in UML using class/object diagrams and state charts, augmented with OCL constraints. Based on two versions of a given model, an automated process deduces the impact of model evolutions on the existing tests. Our methodology then classifies tests into different test suites to test evolution, regression, stagnation and deletion on the concrete system. We introduce the notion of tests and test suites life cycles that help defining the purpose of each test at a given step of the system evolution, and thus, their classification in different test suites. The approach is illustrated on a realistic case study, and the improvements w.r.t. other regression testing techniques are discussed.
http://hdl.handle.net/10993/9796
10.1109/ICSTW.2011.95
http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5954401&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5954401

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