Reference : In-depth resolved Raman scattering analysis for the identification of secondary phase...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/8599
In-depth resolved Raman scattering analysis for the identification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications
English
Fontané, Xavier [> >]
Calvo-Barrio, L. [> >]
Izquierdo-Roca, V. [> >]
Saucedo, E. [> >]
Pérez-Rodriguez, A. [> >]
Morante, J. R. [> >]
Berg, D. M. [> >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
2011
Applied Physics Letters
American Institute of Physics
98
181905
1819051-1819053
Yes (verified by ORBilu)
0003-6951
http://hdl.handle.net/10993/8599

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