Reference : Finite element simulation of metal-semiconductor-metal photodetector
Scientific journals : Article
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/10993/6786
Finite element simulation of metal-semiconductor-metal photodetector
English
Guarino, G. [University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics]
Donaldson, W. R. [University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics]
Mikulics, Martin [Research Centre Jülich, D-52425 Jülich, Germany > Institute of Bio- and Nanosystems and Jülich-Aachen Research Alliance, JARA, Fundamentals of Future Information Technology]
Marso, Michel mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit >]
Kordos, Peter [Slovak Academy of Sciences, SK-84104 Bratislava, Slovak Republic > Institute of Electrical Engineering]
Sobolewski, Roman [University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics]
2009
Solid-State Electronics
Pergamon Press - An Imprint of Elsevier Science
53
10
1144-1148
Yes (verified by ORBilu)
0038-1101
Researchers ; Professionals ; Students
http://hdl.handle.net/10993/6786

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