Reference : Towards future III-nitride based THz OEICs in the UV range
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/10993/6351
Towards future III-nitride based THz OEICs in the UV range
English
Fox, Alfred [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies]
Mikulics, Martin [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies]
Winden, Andreas [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies]
Hardtdegen, Hilde [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies]
Gregusova, Dagmar [Slovak Academy of Sciences, SK-84104 Bratislava, Slovak Republic > Institute of Electrical Engineering]
Adam, Roman [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies > > Peter Grünberg Institute (PGI-6)]
Sobolewski, Roman [University of Rochester, Rochester, New York 14627-0231 > Department of Electrical and Computer Engineering and Laboratory for Laser Energetics, Department of Physics and Astronomy and Laboratory for Laser Energetics]
Marso, Michel mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit >]
Grützmacher, Detlev [Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies]
Kordos, Peter [Institute of Electrical Engineering, Slovak Academy of Sciences, SK-84104 Bratislava, and Department of Microelectronics, Slovak Technical University, SK-81219 Bratislava, Slovak Republic]
2012
ASDAM 2012, The Ninth International Conference on Advanced Semiconductor Devices and Microsystems
191 - 194
No
International
978-1-4673-1195-3
ASDAM 2012, The Ninth International Conference on Advanced Semiconductor Devices and Microsystems
11-11-2012 - 15-11-2012
http://hdl.handle.net/10993/6351

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