Reference : Tomographic characterization of grain-size correlations in polycrystalline Al-Sn
Parts of books : Contribution to collective works
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/547
Tomographic characterization of grain-size correlations in polycrystalline Al-Sn
English
Krill III, C. E. [> >]
Döbrich, K. M. [> >]
Michels, D. [> >]
Michels, Andreas mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Rau, C. [> >]
Weitkamp, T. [> >]
Snigirev, A. [> >]
Birringer, R. [> >]
Bonse, U. [> >]
2002
Developments in X-Ray Tomography III
The International Society for Optical Engineering
205-212
Yes
http://hdl.handle.net/10993/547

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