Reference : Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Scientific congresses, symposiums and conference proceedings : Paper published in a journal
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/4894
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
English
Perrouin, Gilles [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Sen, Sagar [IRISA/INRIA Rennes, France /Triskell]
Klein, Jacques mailto [ISC Department, CRP Gabriel Lippmann, Luxembourg]
Baudry, Benoit [IRISA/INRIA Rennes, France /Triskell]
Le Traon, Yves mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
2010
International Conference on Software Test and Validation
IEEE Computer Society
Yes
International
ICST 2010
from 6-04-2010 to 10-04-2010
Paris
France
http://hdl.handle.net/10993/4894
http://vps.it-sudparis.eu/icst2010/icst2010v4_fichiers/prog_ICST_complet.pdf

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