Reference : Empirical Evaluation of Mutation-based Test Prioritization Techniques
Scientific journals : Article
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/37485
Empirical Evaluation of Mutation-based Test Prioritization Techniques
English
Shin, Donghwan []
Yoo, Shin []
Papadakis, Mike mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > Computer Science and Communications Research Unit (CSC) >]
Bae, Doo-Hwan []
In press
Software Testing, Verification and Reliability
John Wiley & Sons
Yes (verified by ORBilu)
International
0960-0833
1099-1689
Hoboken
NJ
http://hdl.handle.net/10993/37485

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