Reference : Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical stu...
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
Security, Reliability and Trust
http://hdl.handle.net/10993/34950
Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
English
Papadakis, Mike mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Shin, Donghwan []
Yoo, Shin []
Bae, Doo-Hwan []
2018
40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden
Yes
International
40th International Conference on Software Engineering (ICSE'18)
from 27-5-2018 t0 3-6-2018
http://hdl.handle.net/10993/34950

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