Reference : Optical properties of Cu2ZnSnSe4 thin films and identification of secondary phases by...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Physics and Materials Science
http://hdl.handle.net/10993/33064
Optical properties of Cu2ZnSnSe4 thin films and identification of secondary phases by spectroscopic ellipsometry
English
Demircioglu, Ozden [> >]
Salas, Jose Fabio Lopez [> >]
Rey, Germain mailto []
Weiss, Thomas [> >]
Mousel, Marina [> >]
Redinger, Alex mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit]
Susanne, Siebentritt [> >]
Parisi, Juergen [> >]
Guetay, Levent [> >]
2017
OPTICS EXPRESS
25
5
5327-5340
Yes (verified by ORBilu)
International
1094-4087
[en] We apply spectroscopic ellipsometry (SE) to identify secondary phases in Cu2ZnSnSe4 (CZTSe) absorbers and to investigate the optical properties of CZTSe. A detailed optical model is used to extract the optical parameters, such as refractive index and extinction coefficient in order to extrapolate the band gap values of CZTSe samples, and to obtain information about the presence of secondary phases at the front and back sides of the samples. We show that SE can be used as a non-destructive method for detection of the secondary phases ZnSe and MoSe2 and to extrapolate the band gap values of CZTSe phase. (C) 2017 Optical Society of America
http://hdl.handle.net/10993/33064
10.1364/OE.25.005327

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