Reference : Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/28142
Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers
English
Weiss, Thomas mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Redinger, Alex mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Rey, Germain mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Schwarz, Torsten [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Spies, Maria [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Cojocura-Mir edin, Oana [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Choi, P. P. [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Jul-2016
Journal of Applied Physics
American Institute of Physics
120
045703
Yes (verified by ORBilu)
International
0021-8979
1089-7550
Melville
NY
http://hdl.handle.net/10993/28142
10.1063/1.4959611

File(s) associated to this reference

Fulltext file(s):

FileCommentaryVersionSizeAccess
Limited access
2016_Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers.pdfPublisher postprint1.53 MBRequest a copy

Bookmark and Share SFX Query

All documents in ORBilu are protected by a user license.